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Proceedings Paper

Back-illuminated 1024 x 1024 quadrant readout imager: operation and screening test results
Author(s): Harry H. Marsh; Raymond Hayes; Morley M. Blouke; Fanling H. Yang
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Paper Abstract

The Tektronix CCD Manufacturing Group has applied their thinning back surface enhancement and anti-reflection coating processes to produce a 1024 by 1024 chargecoupled device imager with high quantum efficiency (QE) from 350 to 1 100 nm. The TK1O24AB device designed for scientific imaging applications features low noise wide dynamic range excellent charge transfer efficiency and low dark current. The quad-output architecture permits the simultaneous readout of each quarter of the device reducing the time to read out the CCD to that of a 5 12 by 512 device. This paper summarizes the test results from several lots of TK 1024AB runs. The subjects covered include: QE the on-chip amplifier characteristics dark current measurement CTE and characterization of various defects. The paper will also describe the test hardware and procedures used to evaluate the performance of the devices.

Paper Details

Date Published: 1 July 1991
PDF: 12 pages
Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); doi: 10.1117/12.45334
Show Author Affiliations
Harry H. Marsh, Tektronix, Inc. (United States)
Raymond Hayes, Tektronix, Inc. (United States)
Morley M. Blouke, Tektronix, Inc. (United States)
Fanling H. Yang, Tektronix, Inc. (United States)

Published in SPIE Proceedings Vol. 1447:
Charge-Coupled Devices and Solid State Optical Sensors II
Morley M. Blouke, Editor(s)

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