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Proceedings Paper

Results of a new polarization simulation
Author(s): Matthew P. Fetrow; David Wellems; Stephanie H. Sposato; Kenneth P. Bishop; Thomas R. Caudill; Michael L. Davis; Elizabeth R. Simrell
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Paper Abstract

Including polarization signatures of material samples in passive sensing may enhance target detection capabilities. To obtain more information on this potential improvement, a simulation is being developed to aid in interpreting IR polarization measurements in a complex environment. The simulation accounts for the background, or incident illumination, and the scattering and emission from the target into the sensor. MODTRAN, in combination with a dipole approximation to singly scattered radiance, is used to polarimetrically model the background, or sky conditions. The scattering and emission from rough surfaces are calculated using an energy conserving polarimetric Torrance and Sparrow BRDF model. The simulation can be used to examine the surface properties of materials in a laboratory environment, to investigate IR polarization signatures in the field, or a complex environment, and to predict trends in LWIR polarization data. In this paper we discuss the simulation architecture, the process for determining and roughness as a function of wavelength, which involves making polarization measurements of flat glass plates at various angles and temperatures in the laboratory at Kirtland AF Base, and the comparison of the simulation with field dat taken at Elgin Air Force Base. The later process entails using the extrapolated index of refraction and surface roughness, and a polarimetric incident sky dome generated by MODTRAN. We also present some parametric studies in which the sky condition, the sky temperature and the sensor declination angle were all varied.

Paper Details

Date Published: 9 January 2002
PDF: 14 pages
Proc. SPIE 4481, Polarization Analysis and Measurement IV, (9 January 2002); doi: 10.1117/12.452902
Show Author Affiliations
Matthew P. Fetrow, Air Force Research Lab. (United States)
David Wellems, Applied Technology Associates (United States)
Stephanie H. Sposato, Air Force Research Lab. (United States)
Kenneth P. Bishop, Applied Technology Associates (United States)
Thomas R. Caudill, Air Force Research Lab. (United States)
Michael L. Davis, Air Force Research Lab. (United States)
Elizabeth R. Simrell, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4481:
Polarization Analysis and Measurement IV
Dennis H. Goldstein; Walter G. Egan; David B. Chenault; Michael J. Duggin; Walter G. Egan; Michael J. Duggin, Editor(s)

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