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Proceedings Paper

Magnified hard x-ray microtomography: toward tomography with submicron resolution
Author(s): Christian G. Schroer; Boris Benner; Til Florian Guenzler; Marion Kuhlmann; Bruno Lengeler; Christoph Rau; Timm Weitkamp; Anatoly A. Snigirev; Irina Snigireva
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Paper Abstract

Parabolic compound refractive lenses (PCRLs) are high quality imaging optics for hard x-rays that can be used as an objective lens in a new type of hard x-ray full field microscope. Using an aluminium PCRL, this new type of microscope has been shown to have a resolution of 350 nm. Further improvement of the resolution down to 50 nm can be expected using beryllium as a lens material. The large depth of field (several mm) of the microscope results in sharp projection images for samples that fit into the field of view of about 300 micrometers. This allows to combine magnified imaging with tomographic techniques. First results of magnified microtomography are shown. Contrast formation in the microscope and the consequences for tomographic reconstruction are discussed. An outlook on further developments is given.

Paper Details

Date Published: 7 January 2002
PDF: 11 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452858
Show Author Affiliations
Christian G. Schroer, RWTH Aachen (Germany)
Boris Benner, RWTH Aachen (Germany)
Til Florian Guenzler, RWTH Aachen (Germany)
Marion Kuhlmann, RWTH Aachen (Germany)
Bruno Lengeler, RWTH Aachen (Germany)
Christoph Rau, European Synchrotron Radiation Facility (France)
Timm Weitkamp, European Synchrotron Radiation Facility (France)
Anatoly A. Snigirev, European Synchrotron Radiation Facility (France)
Irina Snigireva, European Synchrotron Radiation Facility (France)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

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