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Proceedings Paper

High-resolution high-speed CT/radiography system for NDT of adhesive bonded composites
Author(s): Vivek V. Nagarkar; Stuart R. Miller; Sameer V. Tipnis; Valeriy B. Gaysinskiy; Alexander Lempicki; Charles Brecher
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Paper Abstract

Adhesive bonded composites used in naval, aerospace, and automotive technologies require routine nondestructive testing (NDT) to detect flaws and other integrity-reducing anomalies such as porosity, kissing disbonds, and delaminations. We have developed an x-ray radiography/CT system with fast scanning times based on high resolution, high efficiency scintillators coupled to a 1024 x 1024 pixel CCD via a fiberoptic taper. Typical CT systems for NDT use a fan beam x-ray source and a linear array of detectors, with scan times on the order of 10 hours depending on the desired resolution. The prototype CCD-based volumetric imaging system described here is capable of reducing this scan time to less than 1 hour while significantly improving resolution. Additionally, the system is capable of both CT and standard radiographic imaging. We have integrated two different scintillators in the prototype system. One is a structured CsI(Tl) screen, and the other is a new, pixelated, transparent optical ceramic (TOC) scintillator. This unique TOC has a density of 9.5 g/cm3 and a peak emission of 610 nm, particularly suitable for Si readouts. We present here the system design and preliminary results of radiographic imaging and volumetric CT reconstruction.

Paper Details

Date Published: 7 January 2002
PDF: 9 pages
Proc. SPIE 4503, Developments in X-Ray Tomography III, (7 January 2002); doi: 10.1117/12.452852
Show Author Affiliations
Vivek V. Nagarkar, Radiation Monitoring Devices, Inc. (United States)
Stuart R. Miller, Radiation Monitoring Devices, Inc. (United States)
Sameer V. Tipnis, Radiation Monitoring Devices, Inc. (United States)
Valeriy B. Gaysinskiy, Radiation Monitoring Devices, Inc. (United States)
Alexander Lempicki, ALEM Associates (United States)
Charles Brecher, ALEM Associates (United States)

Published in SPIE Proceedings Vol. 4503:
Developments in X-Ray Tomography III
Ulrich Bonse, Editor(s)

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