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Proceedings Paper

Silicon nanocrystals microcavity
Author(s): D. Amans; S. Callard; A. Gagnaire; Jacques Joseph; G. Ledoux; Friedrich Huisken
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Paper Abstract

We report the fabrication of dielectric mirrors microcavity with silicon nanocrystals layer as the emitting layer. The fabrication process allowed the non degradation of the optical properties of the emettors. By angular-resolved photoluminescence, we investigated changes in angular emission pattern caused by a half cavity and a full cavity. We show that the whole energy emitted in the half cavity vertical cone emission is concentrated in the sharp full cavity vertical cone emission.

Paper Details

Date Published: 5 November 2002
PDF: 11 pages
Proc. SPIE 4808, Optical Properties of Nanocrystals, (5 November 2002); doi: 10.1117/12.452318
Show Author Affiliations
D. Amans, Ecole Centrale de Lyon (France)
S. Callard, Ecole Centrale de Lyon (France)
A. Gagnaire, Ecole Centrale de Lyon (France)
Jacques Joseph, Ecole Centrale de Lyon (France)
G. Ledoux, Max-Planck-Institut für Strömungsforschung (Germany)
Friedrich Huisken, Max-Planck-Institut für Strömungsforschung (Germany)

Published in SPIE Proceedings Vol. 4808:
Optical Properties of Nanocrystals
Zeno Gaburro, Editor(s)

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