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Proceedings Paper

Compact high-energy x-ray inspection systems for screening air cargo
Author(s): William Wade Sapp Jr.; Lee Grodzins; Peter J. Rothschild; Richard L. Schueller
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Paper Abstract

A modular 2 MeV Shaped Energy™ system complemented with two 220 keV scanning pencil beam systems is described. With the scanning x-ray pencil beams providing backscatter imaging, this multi-source system has excellent detection capabilities, low radiation dose, and a small footprint for inspecting air cargo containers in a crowded airport environment. Its design is based on a prototype inspection system with a 3.5 MeV Shaped Energy source and segmented transmission detector complemented with two 450 keV scanning pencil beam systems. This higher energy system was designed for very high density cargo such as fully loaded ISO shipping containers. The unique modular design provides maximum detection with minimum radiation because both the Shaped Energy system and the lower energy systems can be independently optimized. Moreover, the combination of high-resolution transmission coupled with backscatter provides increased probability of detecting threats. A novel configuration of these same modules could be applied to a proposed CT air cargo inspection system with true density determining capabilities. Sample images from the existing 3.5 MeV prototype system will be presented along with recent test results.

Paper Details

Date Published: 26 November 2002
PDF: 7 pages
Proc. SPIE 4786, Penetrating Radiation Systems and Applications IV, (26 November 2002); doi: 10.1117/12.451329
Show Author Affiliations
William Wade Sapp Jr., American Science and Engineering, Inc. (United States)
Lee Grodzins, American Science and Engineering, Inc. (United States)
Peter J. Rothschild, American Science and Engineering, Inc. (United States)
Richard L. Schueller, American Science and Engineering, Inc. (United States)

Published in SPIE Proceedings Vol. 4786:
Penetrating Radiation Systems and Applications IV
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Lisa J. Porter; Edward J. Morton, Editor(s)

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