Share Email Print

Proceedings Paper

3DX: a micromachined silicon crystallographic x-ray detector
Author(s): John Morse; Christopher J. Kenney; Edwin M. Westbrook; Istvan Naday; Sherwood I. Parker
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We are developing pixel detectors for macromolecular crystallography, in which diffracted X-rays are directly absorbed by high-resistivity, crystalline silicon that has been micro-machined by inductively-coupled plasma etching. Arrays of 64 × 64 holes at 150 μm pitch are first formed by etching through the entire silicon bulk, then backfilled with polysilicon that is doped to create conducting p and n type columnar electrodes. When reverse biased, these electrodes generate electric fields that define the individual pixels. By forming conducting polysilicon on the sides of the sensors, which are cut-out of the silicon wafer by plasma etching, the entire surface of the detector may be made active. CMOS readout integrated circuits are conductively bump bonded behind each 3D detector, providing a direct connection to every pixel. A large array will be assembled with no insensitive bands along the edges by overlapping these sensors, each of area 0.96cm2. This detector will measure X-ray signal intensities of up to 105 events/pixel/sec without any pile-up loss, by using an integration method that retains the benefits of discrete photon counting. The detector sensitivity will be highly uniform, it will not exhibit any dark signal or spurious noise, and no geometric distortion will occur within each sensor.

Paper Details

Date Published: 10 January 2003
PDF: 10 pages
Proc. SPIE 4784, X-Ray and Gamma-Ray Detectors and Applications IV, (10 January 2003); doi: 10.1117/12.451164
Show Author Affiliations
John Morse, Molecular Biology Consortium (United States)
Christopher J. Kenney, Molecular Biology Consortium (United States)
Edwin M. Westbrook, Molecular Biology Consortium (United States)
Istvan Naday, Argonne National Lab. (United States)
Sherwood I. Parker, Univ. of Hawaii (United States)

Published in SPIE Proceedings Vol. 4784:
X-Ray and Gamma-Ray Detectors and Applications IV
Ralph B. James; Edwin M. Westbrook; Roger D. Durst; Larry A. Franks; Arnold Burger; Edwin M. Westbrook; Roger D. Durst, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?