
Proceedings Paper
Selective discrimination capability in optical pattern recognition using available SLMsFormat | Member Price | Non-Member Price |
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Paper Abstract
Optical correlation for pattern recognition with selective and adjustable discrimination capability is based on the Dual Nonlinear Correlation (DNC) algorithm and on a two-step Joint Transform Correlator (JTC) architecture. The DNC encompasses nonlinear power-law processing operating independently on the spectra of the input image and the reference target. But the eventual capabilities of the system strongly depend on some experimental conditions such as quantization, gray-level dynamic range, saturation and other technical characteristics of both the camera and the spatial light modulator used in the JTC. In this work we explore these capabilities for three available modulators (Epson and two different CRLs) acting in both the input and the modified joint power spectra planes for the first and second steps of the JTC, respectively.
Paper Details
Date Published: 26 December 2001
PDF: 12 pages
Proc. SPIE 4435, Wave Optics and VLSI Photonic Devices for Information Processing, (26 December 2001); doi: 10.1117/12.451138
Published in SPIE Proceedings Vol. 4435:
Wave Optics and VLSI Photonic Devices for Information Processing
Pierre Ambs; Fred Richard Beyette Jr.; Fred Richard Beyette Jr., Editor(s)
PDF: 12 pages
Proc. SPIE 4435, Wave Optics and VLSI Photonic Devices for Information Processing, (26 December 2001); doi: 10.1117/12.451138
Show Author Affiliations
Elisabet Perez, Univ. Politecnica de Catalunya (Spain)
Maria Sagrario Millan Garcia-Verela, Univ. Politecnica de Catalunya (Spain)
Maria Sagrario Millan Garcia-Verela, Univ. Politecnica de Catalunya (Spain)
Katarzyna Chalasinska-Macukow, Warsaw Univ. (Poland)
Jesus Maria Garcia, Univ. Politecnica de Catalunya (Spain)
Jesus Maria Garcia, Univ. Politecnica de Catalunya (Spain)
Published in SPIE Proceedings Vol. 4435:
Wave Optics and VLSI Photonic Devices for Information Processing
Pierre Ambs; Fred Richard Beyette Jr.; Fred Richard Beyette Jr., Editor(s)
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