Proceedings Paper
Applications of x-ray intensity interferometry| Format | Member Price | Non-Member Price |
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Paper Abstract
Intensity interferometry was applied for characterizing hard synchrotron radiation. Propagation of transverse coherence was evaluated by a couple of coincidence measurements, which have different source-to-image distances. Influences of phase object under several conditions were measured and discussed. X-ray pulse width was determined with high accuracy by scanning bandwidth of monochromator. Application to the next generation synchrotron sources was discussed.
Paper Details
Date Published: 24 December 2002
PDF: 10 pages
Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); doi: 10.1117/12.450979
Published in SPIE Proceedings Vol. 4782:
X-Ray Mirrors, Crystals, and Multilayers II
Andreas K. Freund; Albert T. Macrander; Tetsuya Ishikawa; James L. Wood, Editor(s)
PDF: 10 pages
Proc. SPIE 4782, X-Ray Mirrors, Crystals, and Multilayers II, (24 December 2002); doi: 10.1117/12.450979
Show Author Affiliations
Makina Yabashi, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
Kenji Tamasaku, SPring-8/RIKEN (Japan)
Kenji Tamasaku, SPring-8/RIKEN (Japan)
Tetsuya Ishikawa, SPring-8/Japan Synchrotron Radiation Research Institute (Japan)
SPring-8/RIKEN (Japan)
SPring-8/RIKEN (Japan)
Published in SPIE Proceedings Vol. 4782:
X-Ray Mirrors, Crystals, and Multilayers II
Andreas K. Freund; Albert T. Macrander; Tetsuya Ishikawa; James L. Wood, Editor(s)
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