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Proceedings Paper

X-ray interferometry: ultra-high-resolution astronomy
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Paper Abstract

X-rays have tremendous potential for imaging at the highest angular resolution. The high surface brightness of many x-ray sources will reveal angular scales heretofore thought unreachable. The short wavelengths make instrumentation compact and baselines short. We discuss how practical x-ray interferometers can be built for astronomy using existing technology. We describe the Maxim Pathfinder and Maxim missions which will achieve 100 and 0.1 micro-arcsecond imaging respectively. The science to be tackled with resolution of up to one million times that of HST will be outlined, with emphasis on eventually imaging the event horizon of a black hole.

Paper Details

Date Published: 20 December 2001
PDF: 9 pages
Proc. SPIE 4506, Soft X-Ray and EUV Imaging Systems II, (20 December 2001); doi: 10.1117/12.450952
Show Author Affiliations
Webster C. Cash, Univ. of Colorado/Boulder (United States)
Ann F. Shipley, Univ. of Colorado/Boulder (United States)
Randall Lee McEntaffer, Univ. of Colorado/Boulder (United States)

Published in SPIE Proceedings Vol. 4506:
Soft X-Ray and EUV Imaging Systems II
Daniel A. Tichenor; James A. Folta, Editor(s)

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