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Proceedings Paper

Scattered radiation from radiographic intensifying screen: a Monte Carlo simulation
Author(s): Regina C. Barroso; Delson Braz; Marcelino J. Anjos; Ricardo Tadeu Lopes; Carlos A. Castro
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Paper Abstract

In radiology, the X-ray film is placed between two screens. The development of radiological intensifying screens has reduced the radiation dose in patients about a factor of 10 in the last decades. The sensitivity of X-ray films is enlarged due to the fluorescent light from these screens. In addition, the primary radiation can be scattered coherently (Rayleigh scattering) and incoherently (Compton scattering) which will degrade the image resolution. Scattered radiation produced in Gd2O2Si:Tb intensifying screens was simulated by using a Monte Carlo radiation transport code - the EGS4 (Electron - Gamma Shower), which is a general purpose package for Monte Carlo simulation of the coupled transport of electrons and photons. The magnitude of scattered radiation striking the film is typically quantified using the scatter to primary radiation (SPR). The angular distribution of the intensity of the scattered radiation (sum of both the scattering effects) was simulated, showing that the ratio of scatter- to-primary radiation incident on the X-ray film is about 8.39% and 7.73% for the front and back screen, respectively, over the range from 0 to (pi) rad.

Paper Details

Date Published: 19 December 2001
PDF: 5 pages
Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); doi: 10.1117/12.450787
Show Author Affiliations
Regina C. Barroso, Univ. Federal do Rio de Janeiro (Brazil)
Delson Braz, Univ. Federal do Rio de Janeiro (Brazil)
Marcelino J. Anjos, Univ. Federal do Rio de Janeiro (Brazil)
Ricardo Tadeu Lopes, Univ. Federal do Rio de Janeiro (Brazil)
Carlos A. Castro, Univ. Federal do Rio de Janeiro (Brazil)

Published in SPIE Proceedings Vol. 4508:
Penetrating Radiation Systems and Applications III
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Richard C. Schirato; Edward J. Morton, Editor(s)

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