Share Email Print

Proceedings Paper

Importance of Doppler broadening in Compton scatter imaging techniques
Author(s): Donepudi V. Rao; Tohoru Takeda; Yuji Itai; S. M. Seltzer; John H. Hubbell; Tsutomu Zeniya; Takao Akatsuka; Roberto Cesareo; Antonio Brunetti; Giovanni E. Gigante
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Compton scattering is a potential tool for the determination of bone mineral content or tissue density for dose planning purposes, and requires knowledge of the energy distribution of the X-rays through biological materials of medical interest in the X-ray and (gamma) -ray region. The energy distribution is utilized in a number of ways in diagnostic radiology, for example, in determining primary photon spectra, electron densities in separate volumes, and in tomography and imaging. The choice of the X-ray energy is more related to X-ray absorption, where as that of the scattering angle is more related to geometry. The evaluation of all the contributions are mandatory in Compton profile measurements and is important in X-ray imaging systems in order to achieve good results. In view of this, Compton profile cross-sections for few biological materials are estimated at nineteen K(alpha) X-ray energies and 60 keV (Am-241) photons. Energy broadening, geometrical broadening from 1 to 180 degree(s), FWHM of J(Pz) and FWHM of Compton energy broadening has been evaluated at various incident photon energies. These values are estimated around the centroid of the Compton profile with an energy interval of 0.1 keV and 1.0 keV for 60 keV photons. The interaction cross sections for the above materials are estimated using fractions-by-weight of the constituent elements. Input data for these tables are purely theoretical.

Paper Details

Date Published: 19 December 2001
PDF: 10 pages
Proc. SPIE 4508, Penetrating Radiation Systems and Applications III, (19 December 2001); doi: 10.1117/12.450783
Show Author Affiliations
Donepudi V. Rao, Univ. of Tsukuba (India)
Tohoru Takeda, Univ. of Tsukuba (Japan)
Yuji Itai, Univ. of Tsukuba (Japan)
S. M. Seltzer, National Institute of Standards and Technology (United States)
John H. Hubbell, National Institute of Standards and Technology (United States)
Tsutomu Zeniya, Yamagata Univ. (Japan)
Takao Akatsuka, Yamagata Univ. (Japan)
Roberto Cesareo, Univ. degli Studi di Sassari (Italy)
Antonio Brunetti, Univ. degli Studi di Sassari (Italy)
Giovanni E. Gigante, Univ. degli Studi di Roma La Sapienza (Italy)

Published in SPIE Proceedings Vol. 4508:
Penetrating Radiation Systems and Applications III
H. Bradford Barber; Hans Roehrig; F. Patrick Doty; Richard C. Schirato; Edward J. Morton, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?