Share Email Print

Proceedings Paper

Multichannel fast hard x-ray spectrometer with spatial resolution capability for extended z-pinch plasma sources
Author(s): Hank LeBeau; Dmitry A. Fedin; Victor L. Kantsyrev; Bruno S. Bauer; Sean Keely; A. Kessler; Wade Cline; Gene Newman
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A multi-channel, fast, hard x-ray diode spectrometer is being developed at the Nevada Terawatt facility. This spectrometer helps facilitate the study of the time evolution of hard x-ray emissions from hot, dense plasma. Each channel in the array can be adjusted individually with shielded view areas, allowing small areas of an x-ray source to be isolated and studied by region. This spatial resolution capability will permit a better understanding of the mechanisms present in hot, dense plasma. Results will be presented of experimental tests, and their interpretation, pertaining to the hard x-ray emissions generated from an x-pinch source in a pulse-power type device.

Paper Details

Date Published: 18 December 2001
PDF: 5 pages
Proc. SPIE 4507, Hard X-Ray and Gamma-Ray Detector Physics III, (18 December 2001); doi: 10.1117/12.450764
Show Author Affiliations
Hank LeBeau, Univ. of Nevada/Reno (United States)
Dmitry A. Fedin, Univ. of Nevada/Reno (United States)
Victor L. Kantsyrev, Univ. of Nevada/Reno (United States)
Bruno S. Bauer, Univ. of Nevada/Reno (United States)
Sean Keely, Univ. of Nevada/Reno (United States)
A. Kessler, Univ. of Nevada/Reno (United States)
Wade Cline, Univ. of Nevada/Reno (United States)
Gene Newman, Univ. of Nevada/Reno (United States)

Published in SPIE Proceedings Vol. 4507:
Hard X-Ray and Gamma-Ray Detector Physics III
Ralph B. James, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?