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Proceedings Paper

Highly flexible and Internet-programmable CCD camera with a frequency-selectable read-out for imaging and spectroscopy applications
Author(s): Luca Gori; Emanuele Pace; Leonardo Tommasi; D. Sarocchi; V. Bagnoli; M. Sozzi; S. Puri
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Paper Abstract

A new concept CCD camera is currently being realized at the XUV Lab of the Department of Astronomy and Space Science of the University of Florence. The main features we aim to get are a high level of versatility and a fast pixel rate. Within this project, a versatile CCD sequencer has been realized with interesting and innovative features. Based on a microcontroller and complex programmable logic devices (CPLD), it allows the selection of all the parameters related to charge transfer and CCD readout (number, duration and overlapping of serial and parallel transfer clocks, number of output nodes, pixel transfer rate) and therefore it allows the use of virtually any CCD sensor. Comparing to a common DSP-based sequencer, it is immune to jitter noise and it can also reach pixel rates greater than 40 MHz. The software interface is LabVIEW 6i based and it will allow both local or remote control and display. Furthermore, it will be possible to remote debug the system and to upgrade the LabVIEW interface itself and also the microcontroller resident program and the CPLD implemented schemes.

Paper Details

Date Published: 10 December 2001
PDF: 12 pages
Proc. SPIE 4498, UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics, (10 December 2001); doi: 10.1117/12.450070
Show Author Affiliations
Luca Gori, Univ. degli Studi di Firenze (Italy)
Emanuele Pace, Univ. degli Studi di Firenze (Italy)
Leonardo Tommasi, Univ. degli Studi di Firenze (Italy)
D. Sarocchi, Univ. degli Studi di Firenze (Italy)
V. Bagnoli, Univ. degli Studi di Firenze (Italy)
M. Sozzi, CAISMI-CNR di Firenze (Italy)
S. Puri, Univ. degli Studi di Firenze (Italy)

Published in SPIE Proceedings Vol. 4498:
UV/EUV and Visible Space Instrumentation for Astronomy and Solar Physics
Oswald H. W. Siegmund; Silvano Fineschi; Mark A. Gummin, Editor(s)

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