Share Email Print

Proceedings Paper

Optical characterization of edge-emitting LEDS (EELEDS) for scanning display applications
Author(s): Eric H. Altendorf; Timothy J. Gong; Margaret K. Brown; James Nissen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Edge emitting LEDs(EELEDs) can be used to generate full color scanned displays. Conventional LEDs lack the high speed modulation characteristics and radiance required for this application. InGaN-based EELEDs can be used for blue and green sources, and InGaP-based EELEDs for red sources. These semiconductor light sources are processed and packaged similar to laser diodes, but the primary source of output radiation is spontaneous emission. In this paper we describe the optical farfield characteristics of EELEDs, as well as their near-field and imaging properties. Comparisons are made to laser diode (LD) sources. The near- fields and far-fields of these devices have characteristics in common with both laser diode and conventional surface emitting LEDs. Smaller emitter dimensions produce laser- diode-like diffraction limited behavior, while larger emitter dimensions supporting higher order optical modes, produce broad far-field intensity distributions, and geometrical imaging characteristics. Partly due to the absence of optical gain, the wall plug efficiencies, and optical power levels, are also much lower than laser diodes.

Paper Details

Date Published: 5 December 2001
PDF: 8 pages
Proc. SPIE 4445, Solid State Lighting and Displays, (5 December 2001); doi: 10.1117/12.450034
Show Author Affiliations
Eric H. Altendorf, Microvision, Inc. (United States)
Timothy J. Gong, Microvision, Inc. (United States)
Margaret K. Brown, Microvision, Inc. (United States)
James Nissen, Oregon Institute of Technology (United States)

Published in SPIE Proceedings Vol. 4445:
Solid State Lighting and Displays
Ian T. Ferguson; Yoon-Soo Park; Nadarajah Narendran; Steven P. DenBaars, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?