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Proceedings Paper

keV-electron-based table-top soft x-ray source
Author(s): Bart Buijsse
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Paper Abstract

A novel soft X-ray source has been developed that generates soft X-rays of 2.36 nm wavelength. The source is based on focusing a 10 keV electron beam on a continuous jet of water, exciting oxygen K(alpha ) characteristic radiation. A high-resolution spectrum was recorded which shows a background-free peak at 2.36 nm with a FWHM of 0.017 nm. The brightness of this source is limited by the amount of electron energy that can be dissipated inside the water jet, without endangering the stability of the source. We succeeded in focusing 60 (mu) A onto one side of the jet, at which value the brightness is ~5*108 photons/(sec sr micrometers 2). The source is of potential interest for use in tabletop soft X-ray microscopy, because the line radiation falls just within the water window, the wavelength region that is employed in this type of microscopy.

Paper Details

Date Published: 6 December 2001
PDF: 8 pages
Proc. SPIE 4502, Advances in Laboratory-based X-Ray Sources and Optics II, (6 December 2001); doi: 10.1117/12.449865
Show Author Affiliations
Bart Buijsse, Philips Research Labs. (Netherlands)

Published in SPIE Proceedings Vol. 4502:
Advances in Laboratory-based X-Ray Sources and Optics II
Ali M. Khounsary; Carolyn A. MacDonald, Editor(s)

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