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Proceedings Paper

Compact crystalline phase monitor for the steel industry
Author(s): Huapeng Huang; Caiyun Chen; Zewu Chen; Tom Bievenue
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Paper Abstract

This paper describes the development of a prototype in-line process monitor for galvannealing processes in the steel industry using parallel beam X-ray diffraction. The implementation of this is to design a simplified X-ray diffraction system monitoring a single phase (FeZn (xi) phase)of the steel surface coating during the galvannealing process. A laboratory base system was built with a low power source combined with a polycapillary collimating optic. Data sets from several steel samples were collected and analyzed. Two-dimensional polycapillary angular filters were used in this system and show that they could increase the single-noise ratio. Data acquisition times were also estimate to detect a change in phase composition. The direction of future work and system improvements for in-line application is also discussed.

Paper Details

Date Published: 6 December 2001
PDF: 9 pages
Proc. SPIE 4502, Advances in Laboratory-based X-Ray Sources and Optics II, (6 December 2001); doi: 10.1117/12.449858
Show Author Affiliations
Huapeng Huang, X-Ray Optical Systems, Inc. (United States)
Caiyun Chen, X-Ray Optical Systems, Inc. (United States)
Zewu Chen, X-Ray Optical Systems, Inc. (United States)
Tom Bievenue, X-Ray Optical Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 4502:
Advances in Laboratory-based X-Ray Sources and Optics II
Ali M. Khounsary; Carolyn A. MacDonald, Editor(s)

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