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Proceedings Paper

High-spatial-resolution and high-sensitivity interferometric optical-time-domain reflectometer
Author(s): Masaru Kobayashi; Juichi Noda; Kazumasa Takada; Henry F. Taylor
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Paper Abstract

An interferometric optical-time-domain reflectometer is presented. The system is a low- coherence interferometer using a superluminescent diode and has a spatial resolution of 20 micrometers . A high-sensitivity system is described which performs balanced and narrow band detections and has a detectable limit of -130 dB, which is 10 dB lower than the Rayleigh scattered light power in optical fibers. A polarization-independent system is proposed which adopts polarization-diversity detection to suppress the influence of the polarization fluctuation of the scattered light. A CO2 laser probing method is applied using the thermo- optic effect to identify scattering centers in optical circuits. Measurement of fault locations, reflectivity, and characterization of optical components with the systems are also described.

Paper Details

Date Published: 1 September 1991
PDF: 7 pages
Proc. SPIE 1474, Optical Technology for Signal Processing Systems, (1 September 1991); doi: 10.1117/12.44932
Show Author Affiliations
Masaru Kobayashi, NTT Opto-Electronics Labs. (Japan)
Juichi Noda, NTT Opto-Electronics Labs. (Japan)
Kazumasa Takada, NTT Communication Switching Labs. (Japan)
Henry F. Taylor, Texas A&M Univ. (United States)

Published in SPIE Proceedings Vol. 1474:
Optical Technology for Signal Processing Systems
Mark P. Bendett, Editor(s)

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