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Proceedings Paper

Edge detection with subpixel accuracy
Author(s): Jack Koplowitz; Xiaobing Lee
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Paper Abstract

The problem of edge detection in images has been to locate those pixels which contain an edge, i.e., a jump in the intensity level. Recently, a number of researchers have turned their attention to obtaining subpixel accuracy in estimating edge location. This work has generally focused on matching a parametric surface to the region in the image where an edge occurs. In this paper a two-dimensional maximum likelihood approach is used to obtain the most likely position and orientation of the edge. Comparisons show that the maximum likelihood approach gives considerably less error in locating the position of the edge over a wide range of noise conditions and blurring which may be unknown to the estimator.

Paper Details

Date Published: 1 August 1991
PDF: 12 pages
Proc. SPIE 1471, Automatic Object Recognition, (1 August 1991); doi: 10.1117/12.44901
Show Author Affiliations
Jack Koplowitz, Clarkson Univ. (United States)
Xiaobing Lee, SBC Technology Resources Inc. (United States)

Published in SPIE Proceedings Vol. 1471:
Automatic Object Recognition
Firooz A. Sadjadi, Editor(s)

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