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Proceedings Paper

Plasmon-mediated visible and near-infrared transmission through sub-30-nm holes in metal films: potential in solar energy applications
Author(s): Geoffrey B. Smith; Sijmen Gerritsen; Moazzem Hossain; Geoffrey McCredie
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Paper Abstract

The recent discovery that electromagnetic radiation can transmit super-efficiently through sub-wavelength holes in metal films and thin metal foils has implications for solar energy and energy efficiency technologies, especially thin metal films and metal particle arrays. The effect involves light induced surface plasmons coupling through the holes to form new states which can resonantly absorb and re-emit photons. They are a virtual bound state for photons. The material must have a dielectric constant below -1, and for noble metals enhancement is strong beyond (lambda) approximately 0.7 micrometers , with a long wavelength limit set by absorption losses, well into the black body spectral range. In aluminium the strong onset is in the visible. Thus control of solar heat gain and thermal radiation can utilize this effect. Broad band or narrow band spectral selectivity are possible, depending on metal thickness and how the holes are arranged with respect to each other. Very interesting effects occur in multilayers, with standard multilayer thin film optics not applying when this phenomena is present. An admittance approach to handling thin film optics in the presence of surface plasmon coupling is addressed.

Paper Details

Date Published: 13 November 2001
PDF: 9 pages
Proc. SPIE 4458, Solar and Switching Materials, (13 November 2001); doi: 10.1117/12.448263
Show Author Affiliations
Geoffrey B. Smith, Univ. of Technology Sydney (Australia)
Sijmen Gerritsen, Univ. of Technology Sydney (Australia)
Moazzem Hossain, Univ. of Technology Sydney (Australia)
Geoffrey McCredie, Univ. of Technology Sydney (Australia)

Published in SPIE Proceedings Vol. 4458:
Solar and Switching Materials
Carl M. Lampert; Carl M. Lampert; Claes-Goran Granqvist; Claes-Goeran Granqvist; Keith L. Lewis; Keith L. Lewis, Editor(s)

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