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Proceedings Paper

Integrated micro 4f-optical imaging system for the characteriztion of mesoscopic DOEs
Author(s): Xiao Gao; Jonathan Bates; David Pustai; Dennis W. Prather
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Paper Abstract

In this paper we present the design and characterization of a micro 4f optical imaging system for the purpose of characterizing mesoscopic diffractive optical elements. To this end, we demonstrate the systems' ability to measure very small variation sin diffraction intensity with high resolution. Because the system is illuminated by both coherent and incoherent sources, we characterize the cutoff frequency and modulation transfer function to determine the spatial resolution of the system. The system is validated by comparing measured results to theoretical predictions.

Paper Details

Date Published: 13 November 2001
PDF: 9 pages
Proc. SPIE 4437, Gradient Index, Miniature, and Diffractive Optical Systems II, (13 November 2001); doi: 10.1117/12.448155
Show Author Affiliations
Xiao Gao, Univ. of Delaware (United States)
Jonathan Bates, Univ. of Delaware (United States)
David Pustai, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)

Published in SPIE Proceedings Vol. 4437:
Gradient Index, Miniature, and Diffractive Optical Systems II
Thomas J. Suleski, Editor(s)

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