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Proceedings Paper

Optocapacity spectroscopy method
Author(s): V. A. Vasiljev
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Paper Abstract

Optocapacity spectroscopy method is offered. This method based on the characteristic of semiconductors to change conduction at the influence of optical radiation. Conduction changing is registered through capacity change between metallic plates, to which fits an under investigation sample. The method is noncontact and allows to research samples of semiconductors, which thickness less, than diffusion length of free carriers of charge.

Paper Details

Date Published: 15 November 2001
PDF: 10 pages
Proc. SPIE 4605, PECS 2001: Photon Echo and Coherent Spectroscopy, (15 November 2001); doi: 10.1117/12.447942
Show Author Affiliations
V. A. Vasiljev, Penza State Univ. (Russia)

Published in SPIE Proceedings Vol. 4605:
PECS 2001: Photon Echo and Coherent Spectroscopy
Vitaly V. Samartsev, Editor(s)

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