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Proceedings Paper

Scientific basis for traceable dimensional measurements in a nanometer range: methods and concepts
Author(s): Alexandre Titov; Igor Malinovsky; C. A. Massone
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Paper Abstract

New parallax-free methods of interferometric length measurements, developed recently at INMETRO, give the possibility to exclude, practically completely, the uncertainties related to the wringing procedure of a gauge block to a reference plate. It is shown experimentally that the uncertainty of the length measurement by optical interferometry can be reduced to the value of about 1 angstrom. The temperature measurements of a material artifact are demonstrated with the uncertainty of less than 0.1 milli-Kelvin. There are no basic restrictions for the improvement of the practical realization of the SI length unit, based on the measurements of material length standards by optical interferometry to the level of approximately 0.001 ppm. Two new, independent length specifying parameter fora gauge block are introduced, i.e. the mechanical and optical lengths of a block, which correspond to the length measurements with the uncertainty level indicated above. Parallax-free measurements of the optical length of the block has been performed for a 'free' block in unperturbed state. Basically new concept for length metrology, i.e. the concept of a free, unperturbed artifact, has been introduced into the length measurements.

Paper Details

Date Published: 22 October 2001
PDF: 11 pages
Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); doi: 10.1117/12.445636
Show Author Affiliations
Alexandre Titov, National Metrology Institute (Brazil)
Igor Malinovsky, National Metrology Institute (Brazil)
C. A. Massone, National Metrology Institute (Brazil)

Published in SPIE Proceedings Vol. 4401:
Recent Developments in Traceable Dimensional Measurements
Jennifer E. Decker; Nicholas Brown, Editor(s)

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