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Proceedings Paper

Virtual CMM using Monte Carlo methods based on frequency content of the error signal
Author(s): Bas W. van Dorp; Han Haitjema; Frank Delbressine; Robbert H. Bergmans; Piet H. J. Schellekens
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Paper Abstract

In coordinate measurement metrology, assessment of the measurement uncertainty of a particular measurement is not a straight forward task. A feasible way for calculation of the measurement uncertainty seems to be the use of a Monte Carlo method. In recent years, a number of Monte Carlo methods have been developed for this purpose, we have developed a Monte Carlo method that can be used on CMM's that takes into account, among other factors, the auto correlation of the error signal. We have separated the errors in linearity errors, rotational errors, straightness errors and squareness errors. Special measurement tools have been developed and applied to measure the required parameters. The short-wave as well as the long-wave behavior of the errors of a specific machine have been calibrated. A machine model that takes these effects into account is presented here. The relevant errors of a Zeiss Prismo were measured, and these data were used to calculate the measurement uncertainty of a measurement of a ring gauge. These calculations were compared to real measurements.

Paper Details

Date Published: 22 October 2001
PDF: 10 pages
Proc. SPIE 4401, Recent Developments in Traceable Dimensional Measurements, (22 October 2001); doi: 10.1117/12.445616
Show Author Affiliations
Bas W. van Dorp, Technische Univ. Eindhoven (Netherlands)
Han Haitjema, Technische Univ. Eindhoven (Netherlands)
Frank Delbressine, Technische Univ. Eindhoven (Netherlands)
Robbert H. Bergmans, NMi-Institute for Metrology and Technology (Netherlands)
Piet H. J. Schellekens, Technische Univ. Eindhoven (Netherlands)

Published in SPIE Proceedings Vol. 4401:
Recent Developments in Traceable Dimensional Measurements
Jennifer E. Decker; Nicholas Brown, Editor(s)

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