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Proceedings Paper

Measurement of the behaviors of optoelectron in the photosensitive material by the dielectric spectrum technology
Author(s): Xiaowei Li; Xiaoyong Hu; Li Han; Lifang Dong; Wei Yu
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Paper Abstract

The behaviors of optoelectron have a very important effect on the quality of photosensitive material, especially on the formation of image. In this paper, the dielectric spectrum technology is used to measure the behaviors of optoelectron. The curves of the behaviors of optoelectron are obtained. Many properties of the behaviors of the optoelectron are gotten through the detailed analysis of the results of the measurement. The influences of the behaviors of the optoelectron on the formation of image are analyzed primarily. The results obtained in this paper are valuable to the overall comprehension of the photosensitive mechanism of the silver halide materials and the process of the formation of image.

Paper Details

Date Published: 15 October 2001
PDF: 5 pages
Proc. SPIE 4600, Advances in Microelectronic Device Technology, (15 October 2001); doi: 10.1117/12.444660
Show Author Affiliations
Xiaowei Li, Hebei Univ. (China)
Xiaoyong Hu, Hebei Univ. (China)
Li Han, Hebei Univ. (China)
Lifang Dong, Hebei Univ. (China)
Wei Yu, Hebei Univ. (China)

Published in SPIE Proceedings Vol. 4600:
Advances in Microelectronic Device Technology
Qin-Yi Tong; Ulrich M. Goesele, Editor(s)

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