Proceedings Paper
Resonant and nonresonant ionization in sputtered initiated laser ionization spectrometry| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
Resonant and nonresonant laser ionization of sputtered neutral atoms are compared for silver/gold alloys and silica/silicon wafer implants. The results obtained from these two different ionization schemes represent complementary information on the sputtered species. There are chemical and photofragmentation effects that must be considered for quantitative determinations of the surface and sub-surface species. Both ionization schemes are necessary to obtain complete information on the sample.
Paper Details
Date Published: 1 July 1991
PDF: 7 pages
Proc. SPIE 1435, Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications, (1 July 1991); doi: 10.1117/12.44226
Published in SPIE Proceedings Vol. 1435:
Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications
Bryan L. Fearey, Editor(s)
PDF: 7 pages
Proc. SPIE 1435, Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications, (1 July 1991); doi: 10.1117/12.44226
Show Author Affiliations
George J. Havrilla, BP Research Ctr. (United States)
Mark Nicholas, BP Research Ctr. (United States)
Mark Nicholas, BP Research Ctr. (United States)
Scott R. Bryan, BP Research Ctr. (United States)
J. Gary Pruett, BP Research Ctr. (United States)
J. Gary Pruett, BP Research Ctr. (United States)
Published in SPIE Proceedings Vol. 1435:
Optical Methods for Ultrasensitive Detection and Analysis: Techniques and Applications
Bryan L. Fearey, Editor(s)
© SPIE. Terms of Use
