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Proceedings Paper

Local window approach to detect line segment based on line model in low-quality image
Author(s): Jian-zhen Gao; Jingyu Yang; Mingwu Ren; Han Sun
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Paper Abstract

Finding line segments in an intensity image is one of the most fundamental issues in computer vision and other industry applications. Many methods have been presented, but robust line segment extraction is still a difficult and open problem. In this paper a local window method based on line-model to extract lineal features from low quality image is described. The method utilizes blob-coloring technique to extract potential line-blob in a local window area, then a line segment is discriminate using the line-model.

Paper Details

Date Published: 21 September 2001
PDF: 4 pages
Proc. SPIE 4550, Image Extraction, Segmentation, and Recognition, (21 September 2001); doi: 10.1117/12.441464
Show Author Affiliations
Jian-zhen Gao, Nanjing Univ. of Science and Technology (China)
Jingyu Yang, Nanjing Univ. of Science and Technology (China)
Mingwu Ren, Nanjing Univ. of Science and Technology (China)
Han Sun, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 4550:
Image Extraction, Segmentation, and Recognition
Tianxu Zhang; Bir Bhanu; Ning Shu, Editor(s)

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