Share Email Print

Proceedings Paper

Principle of electro-optical system vulnerbility to ECM(EOSVECM)
Author(s): Juquan Zhang; Yiyu Zhou; Lixin Zhu; Yingshu Yang; Ye Wu; Xiongbing Ye
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This article qualitatively puts forward the uncertainty principle of electro-optical system vulnerability to ECM, a new objective function of EOSVECM, namely the turning point of dominance of utilizing electromagnetic spectrum is pointed out and analyzed, independent and divergent straight-line reasoning rule of dynamics principle used for evaluating EOSVECM quantitatively now, such as maximum- likelihood reasoning, is expanded into systemic and convergent mixed reasoning rule, such as aggregated transduction common-sense reasoning.

Paper Details

Date Published: 18 September 2001
PDF: 6 pages
Proc. SPIE 4556, Data Mining and Applications, (18 September 2001); doi: 10.1117/12.440296
Show Author Affiliations
Juquan Zhang, National Univ. of Defense Technology and Institute of Electronic Engineering (China)
Yiyu Zhou, National Univ. of Defense Technology (China)
Lixin Zhu, Insitute of Electronic Engineering (China)
Yingshu Yang, Insitute of Electronic Engineering (China)
Ye Wu, Insitute of Electronic Engineering (China)
Xiongbing Ye, Insitute of Electronic Engineering (China)

Published in SPIE Proceedings Vol. 4556:
Data Mining and Applications
Deren Li; Jie Yang; Jufu Feng; Shen Wei, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?