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Proceedings Paper

Portable residual stresses measurement device using ESPI and a radial in-plane interferometer
Author(s): Armando Albertazzi Jr.; Cesar Kanda; Maikon R. Borges; Frank Hrebabetzky
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Paper Abstract

This paper presents a new kind of double illumination interferometer used for radial in-plane displacement measurement through electronic speckle pattern interferometry (ESPI). Some characteristics and implementation details are discussed. This new interferometer is used for residual stresses measurement combining, in a very efficient way, the blind hole method and the in-plane radial displacement measurement by ESPI. Algorithms and implementation characteristics are also discussed. A portable device was built to measure residual stress outside the optical bench. Early results show a measurement performance comparable to the conventional blind hole method using strain gages. Measurement time is almost one order less than the strain gage based measurement system.

Paper Details

Date Published: 11 September 2001
PDF: 11 pages
Proc. SPIE 4420, Laser Metrology for Precision Measurement and Inspection in Industry, (11 September 2001); doi: 10.1117/12.439201
Show Author Affiliations
Armando Albertazzi Jr., Univ. Federal de Santa Catarina (Brazil)
Cesar Kanda, Univ. Federal de Santa Catarina (Brazil)
Maikon R. Borges, Univ. Federal de Santa Catarina (Brazil)
Frank Hrebabetzky, Univ. Federal de Santa Catarina (Brazil)

Published in SPIE Proceedings Vol. 4420:
Laser Metrology for Precision Measurement and Inspection in Industry
Armando Albertazzi Jr., Editor(s)

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