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Proceedings Paper

Sapphire statistical characterization and risk reduction program
Author(s): Donald R. McClure; Robert Cayse; David R. Black; Steven M Goodrich; K. Peter D. Lagerloef; Daniel C. Harris; Dale McCullum; Daniel H. Platus; Charles E. Patty Jr.; Robert S. Polvani
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Paper Abstract

The Sapphire Statistical Characterization and Risk Reduction Program tested 1400 4-point flexure bars with different crystal orientations at different temperatures to establish a mechanical strength database for engineering design. Sapphire coupons were selected to represent surfaces on two different missile windows and a missile dome. Sapphire was obtained from the same suppliers used for the windows or dome and, as much as possible, coupons were fabricated in the same manner as the corresponding part of the window or dome. For one missile window, sapphire from one fabricator was 50% stronger than sapphire made to the same specifications from the same blanks by another fabricator. In laser thermal shock tests, sapphire performed better than predicted from flexure tests. Of several nondestructive methods evaluated for their ability to identify mechanically weak specimens, only x-ray topography was correlated with strength for a limited set of specimens.

Paper Details

Date Published: 7 September 2001
PDF: 11 pages
Proc. SPIE 4375, Window and Dome Technologies and Materials VII, (7 September 2001); doi: 10.1117/12.439184
Show Author Affiliations
Donald R. McClure, U.S. Army Space and Missile Defense Command (United States)
Robert Cayse, SY Technology (United States)
David R. Black, National Institute of Standards and Technology (United States)
Steven M Goodrich, Univ. of Dayton Research Institute (United States)
K. Peter D. Lagerloef, Case Western Reserve Univ. (United States)
Daniel C. Harris, Naval Air Warfare Ctr. (United States)
Dale McCullum, Univ. of Dayton Research Institute (United States)
Daniel H. Platus, The Aerospace Corp. (United States)
Charles E. Patty Jr., Teledyne Solutions, Inc. (United States)
Robert S. Polvani, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 4375:
Window and Dome Technologies and Materials VII
Randal W. Tustison, Editor(s)

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