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Proceedings Paper

Optical technique to sense thermal stress in sapphire
Author(s): K. R. Grossman; R. Kelly Frazer; R. Bamberger; Joseph A. Miragliotta
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Paper Abstract

An optical technique for measuring surface stress in chromium-doped sapphire windows is reported. The approach utilizes the well-known effects of temperature and stress on the spectral profile of chromium ion fluorescence in crystalline sapphire. In this study, the sapphire samples were selectively doped with a surface concentration of chromium ions, which provided a direct measure of the stress and temperature in the surface region of the window. A series of fluorescence measurements were performed to calibrate the effects of temperature and mechanical stress on the spectral characteristics of the surface fluorescence. The results of this laboratory study are currently being developed into a dynamic, non-contact probe of stress in infrared seeker windows while under simulated conditions of flight.

Paper Details

Date Published: 7 September 2001
PDF: 8 pages
Proc. SPIE 4375, Window and Dome Technologies and Materials VII, (7 September 2001); doi: 10.1117/12.439182
Show Author Affiliations
K. R. Grossman, The Johns Hopkins Univ. (United States)
R. Kelly Frazer, The Johns Hopkins Univ. (United States)
R. Bamberger, The Johns Hopkins Univ. (United States)
Joseph A. Miragliotta, The Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 4375:
Window and Dome Technologies and Materials VII
Randal W. Tustison, Editor(s)

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