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Proceedings Paper

Spotlight synthetic aperture radar (SAR) requirements evaluation using phenomenology-based image quality metrics
Author(s): Mark S. Clinard; Kristo S. Miettinen; Paul F. Zavattero
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Paper Abstract

Next generation reconnaissance and Automatic Target Detection/Recognition (ATD/R) performance goals will impose new image quality requirements on integrated SAR hardware and software systems. Signal processing techniques using demonstrated non-parametric autofocus methods such as the Phase Gradient Autofocus algorithm and developments in robust super-resolution signal processing offer the opportunity for reducing overall system cost through utilization of less costly hardware options in integrated system design. Traditional requirements on image quality from integrated hardware-software SAR systems have used image quality metrics based on the characteristics of the overall system impulse response function. An additional class of image quality metrics is available based on the performance of the ATD/R algorithms that are to utilize the imagery. The performance of a given SAR system by these measures is expected to be context-sensitive and dependant on both target and clutter characteristics in a manner not necessarily readily characterizable solely in terms of system impulse response function measures of image quality. A simulation illustration of these issues is presented for a test case in which a range of SAR sensor hardware options are processed through a representative texture metric mechanization. Potential performance dependencies on target and clutter characteristics are reviewed and the efficacy of supplementing impulse response function image quality metrics with additional appropriate predictors of ATD/R performance is reviewed.

Paper Details

Date Published: 22 August 2001
PDF: 6 pages
Proc. SPIE 4374, Radar Sensor Technology VI, (22 August 2001); doi: 10.1117/12.438160
Show Author Affiliations
Mark S. Clinard, Eastman Kodak Co. (United States)
Kristo S. Miettinen, Eastman Kodak Co. (United States)
Paul F. Zavattero, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 4374:
Radar Sensor Technology VI
Robert Trebits; James L. Kurtz, Editor(s)

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