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Proceedings Paper

MIRAGE emitter improvements & technology review
Author(s): Steven Lawrence Solomon; Alan Irwin; Jim Oleson; Kevin Sparkman; Anthony M. Gallagher; William Lin; Jianmei Pan
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Paper Abstract

With the increased demand for IR sensor and surveillance systems, there is a growing need for technologies to support their operational readiness. Measurement of sensor characteristics such as sensitivity, MRTD, and dynamic range should be standard in all mission critical systems. The Real-Time Infrared Test Set (RTIR) is a portable system designed to provide in-the-field calibration and testing of IR imaging systems and seekers. RTIR uses the high volume manufacturing processes of the Very Large Scale Integration (VLSI) and the Micro Electromechanical Systems (MEMS) technology to produce a Thermal Pixel Array (TPA). State-of-the-art CMOS processes define all the necessary on-chip digital and analog electronics. When properly driven, this array generates variable temperature,synthetic IR scenes. A nonuniformity measurement of several TPAs is presented.

Paper Details

Date Published: 31 August 2001
PDF: 9 pages
Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438101
Show Author Affiliations
Steven Lawrence Solomon, Acumen Consulting (United States)
Alan Irwin, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Anthony M. Gallagher, Rockwell Science Ctr. (United States)
William Lin, Rockwell Science Ctr. (United States)
Jianmei Pan, Rockwell Science Ctr. (United States)

Published in SPIE Proceedings Vol. 4366:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
Robert Lee Murrer Jr., Editor(s)

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