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Proceedings Paper

Optimization of resistor array infrared projector temporal response
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Paper Abstract

The thermal conduction and electronic drive processes that govern the temporal response of resistor array infrared projectors are reviewed. The characteristics and limitations of the voltage overdrive method that can be implemented for sharpening the temporal response are also discussed. Overdrive is shown to be a viable technique provided sufficient drive power and temperature margins are available outside of the normal dynamic range. It is shown also by analysis of overdrive measurements applied to a Honeywell GE snapshot resistor array that practical real-time overdrive processors can be designed to operate consistently with theoretical predictions.

Paper Details

Date Published: 31 August 2001
PDF: 14 pages
Proc. SPIE 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI, (31 August 2001); doi: 10.1117/12.438097
Show Author Affiliations
Eric M. Olson, Mission Research Corp. (United States)
Owen M. Williams, Defence Science and Technology Organisation (Australia)
Rhoe A. Thompson, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4366:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
Robert Lee Murrer Jr., Editor(s)

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