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Proceedings Paper

High-fidelity diagnostic beam sampling of a tunable high-energy laser
Author(s): John H. Mitchell III; Harold L. Cohen; Stephen T. Hanley
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Paper Abstract

A practical approach has been evaluated and is described for acquiring low-power beam samples from a high-power free electron laser (FEL) with optical fidelity suitable for performance evaluation. The analytical results for polarization and alignment sensitivities related to this sampling technique are discussed.

Paper Details

Date Published: 1 May 1991
PDF: 10 pages
Proc. SPIE 1414, Laser Beam Diagnostics, (1 May 1991); doi: 10.1117/12.43669
Show Author Affiliations
John H. Mitchell III, United Technologies Optical Systems (United States)
Harold L. Cohen, United Technologies Optical Systems (United States)
Stephen T. Hanley, United Technologies Optical Systems (United States)

Published in SPIE Proceedings Vol. 1414:
Laser Beam Diagnostics
Robert N. Hindy; Youssef Kohanzadeh, Editor(s)

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