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Proceedings Paper

Birefringence dispersion mapping: a new technique for testing of optical inhomogeneity in crystalline materials
Author(s): Andrzej L. Bajor
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Paper Abstract

Birefringence dispersion seems to play at least an equal role to birefringence spatial inhomogeneity itself in many optical applications of crystalline materials including especially retardation plates, generators of the 2nd and higher harmonics, or polarizers. Mapping of parameters associated with birefringence dispersion on the entire areas of wafers cut out from crystalline boules seems then to be a powerful tool in testing and research works dealing with optical materials. The method of birefringence dispersion mapping and an automated, computer-controlled spectropolarimeter have been described. Its working has been illustrated by mapping of birefringence dispersion in Cu-doped LiNbO3 influenced by gamma irradiation and thermal annealing.

Paper Details

Date Published: 10 August 2001
PDF: 13 pages
Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); doi: 10.1117/12.435968
Show Author Affiliations
Andrzej L. Bajor, Institute of Electronic Materials Technology (Poland)

Published in SPIE Proceedings Vol. 4517:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light
Maksymilian Pluta, Editor(s)

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