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Proceedings Paper

AFM and optical methods in determining roughness of SERS-active silver electrodes
Author(s): Stefan Kruszewski; T. Kobiela
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Paper Abstract

The results of optical and AFM measurements of SERS-active silver electrodes are presented. The intensity of specularly reflected light from these electrodes was measured and next, the rms roughness determined. The rms roughness of these electrodes were also determined from their AFM profiles. The origins of observed divergences are discussed.

Paper Details

Date Published: 10 August 2001
PDF: 5 pages
Proc. SPIE 4517, Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light, (10 August 2001); doi: 10.1117/12.435960
Show Author Affiliations
Stefan Kruszewski, Univ. of Technology and Agriculture (Poland)
T. Kobiela, Institute of Physical Chemistry (Poland)

Published in SPIE Proceedings Vol. 4517:
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light
Maksymilian Pluta, Editor(s)

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