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Proceedings Paper

Growth and structure of strontium-doped LaGaO3
Author(s): R. Aleksiyko; Marek Berkowski; J. Fink-Finowicki; P. Byszewski; Ryszard Diduszko; E. Kowalska
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Paper Abstract

A series of La1-xSrxGaO3 solid solution single crystal with x equals 0, 0.04 and 0.12 were grown by the Czochralski method and with x equals 0.01, 0.06 and 0.1 by the floating zone method. The segregation coefficient of Sr in LaGaO3 has been found to be keff (Sr) equals 1.25. The crystals were grown from the melt with stoichiometric Ga2O3 amount at a growth rate ranging from 2.5 mm/h for pure LaGaO3 to 1.2 mm/h for La0.88Sr0.12GaO3. The structure of these crystals was investigated by x- ray powder diffraction technique using CuK(alpha ) radiation. The diffraction patterns were analyzed by Rietveld refinement method. Crystals with strontium concentrations from x equals 0 to 0.1 crystallizes adopting Pbnm structure. It was found that deviation from the ideal perovskite structure decreases with rising strontium concentration, finally reaching centrosymmetric Ibmm structure at x equals 0.12. Orthorombic unit cell parameters c and b decreases whereas a increases with x. Thermal analysis proved that the temperature of the first order phase transition observed in pure LaGaO3 at 150 degrees falls to 126 degrees at x equals 0.01 and remains almost constant at higher x.

Paper Details

Date Published: 10 August 2001
PDF: 5 pages
Proc. SPIE 4412, International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals, (10 August 2001); doi: 10.1117/12.435870
Show Author Affiliations
R. Aleksiyko, Institute of Physics (Poland)
Marek Berkowski, Institute of Physics (Poland)
J. Fink-Finowicki, Institute of Physics (Poland)
P. Byszewski, Institute of Physics and Institute of Vacuum Technology (Poland)
Ryszard Diduszko, Institute of Vacuum Technology (Poland)
E. Kowalska, Institute of Vacuum Technology (Poland)

Published in SPIE Proceedings Vol. 4412:
International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals
Antoni Rogalski; Krzysztof Adamiec; Pawel Madejczyk, Editor(s)

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