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Proceedings Paper

Comparison of optical arrangements for determining the optical coefficients of a scattering medium
Author(s): Stephen F. Baker; John G. Walker; Keith I. Hopcraft
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Paper Abstract

A generic analysis for determining the accuracy of extracting the optical coefficients from a scattering medium is presented for measurement systems including CW, temporal and frequency domain configurations. The analysis is based on the relationship between the optical coefficients and a pair of measurables from a measurement system enabling the efficacy of a system to be gauged with the use of analytical models or Monte Carlo simulations. The methodology is sufficiently versatile to allow the performance of different types of measurement system to be compared. For each system considered, different measurables are evaluated to obtain the optimal accuracy. Examples of the many suitable measurables utilized include the moments of the detected intensity distribution in the CW and temporal domain configurations and the phase and modulation of a detected signal in the frequency domain. The error in reconstructing the absorption coefficient from simulated and analytical scattered data is calculated for the frequency and time domain cases and a CW case where the intensity is measured as a function of the distance across a slab of scattering material. The results indicate that cost effective techniques based on measuring the CW intensity have promise in situations where the thickness of the scattering medium may be selected.

Paper Details

Date Published: 29 June 2001
PDF: 12 pages
Proc. SPIE 4250, Optical Tomography and Spectroscopy of Tissue IV, (29 June 2001); doi: 10.1117/12.434494
Show Author Affiliations
Stephen F. Baker, Univ. of Nottingham (United Kingdom)
John G. Walker, Univ. of Nottingham (United Kingdom)
Keith I. Hopcraft, Univ. of Nottingham (United Kingdom)

Published in SPIE Proceedings Vol. 4250:
Optical Tomography and Spectroscopy of Tissue IV
Britton Chance; Robert R. Alfano; Bruce J. Tromberg; Mamoru Tamura; Eva Marie Sevick-Muraca, Editor(s)

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