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Proceedings Paper

Detective quantum efficiency of an x-ray image intensifier chain as a benchmark for amorphous silicon flat-panal detectors
Author(s): Andreas Koch; Jean-Marie Macherel; Thibaut Wirth; Paul M. de Groot; Thierry Ducourant; David Couder; Jean-Pierre Moy; Emmanuel Calais
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Paper Abstract

Amorphous silicon flat panel x-ray detectors (A-Si FXD) are expected eventually to replace traditional x-ray image intensifier systems (XRII) in medical radiography in the long term. The advantages of FXD's are their large detection area, no distortion, no sensitivity to magnetic fields, low weight and compactness. However, they do not provide the high sensitivity of specific optimized systems based on image intensifiers, which approach the sensitivity of single x-ray photon counting in an appropriate configuration whereas the noise equivalent number of photons for an a-Si imager is typically several photons at medical energies. That is, the detective quantum efficiency of an XRII at low dose is expected to be higher.

Paper Details

Date Published: 28 June 2001
PDF: 6 pages
Proc. SPIE 4320, Medical Imaging 2001: Physics of Medical Imaging, (28 June 2001); doi: 10.1117/12.430919
Show Author Affiliations
Andreas Koch, Thales Electron Devices (France)
Jean-Marie Macherel, Thales Electron Devices (France)
Thibaut Wirth, Trixell SAS (France)
Paul M. de Groot, Thales Electron Devices (France)
Thierry Ducourant, Trixell SAS (France)
David Couder, Trixell SAS (France)
Jean-Pierre Moy, Trixell SAS (France)
Emmanuel Calais, Thales Electron Devices (France)

Published in SPIE Proceedings Vol. 4320:
Medical Imaging 2001: Physics of Medical Imaging
Larry E. Antonuk; Martin Joel Yaffe, Editor(s)

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