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Proceedings Paper

SMART Layer and SMART Suitcase for structural health monitoring applications
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Paper Abstract

Knowledge of integrity of in-service structures can greatly enhance their safety and reliability and lower structural maintenance cost. Current practices limit the extent of real-time knowledge that can be obtained from structures during inspection, are labor-intensive and thereby increase life-cycle costs. Utilization of distributed sensors integrated with the structure is a viable and cost-effective means of monitoring the structure and reducing inspection costs. Acellent Technologies is developing a novel system for actively and passively interrogating the health of a structure through an integrated network of sensors and actuators. Acellent's system comprises of SMART Layers, SMART Suitcase and diagnostic software. The patented SMART Layer is a thin dielectric film with an embedded network of distributed piezoelectric actuators/sensors that can be surface-mounted on metallic structures or embedded inside composite structures. The SMART Suitcase is a portable diagnostic unit designed with multiple sensor/actuator channels to interface with the SMART Layer, generate diagnostic signals from actuators and record measurements from the embedded sensors. With appropriate diagnostic software, Acellent's system can be used for monitoring structural condition and for detecting damage while the structures are in service. This paper enumerates on the SMART Layer and SMART Suitcase and their applicability to composite and metal structures.

Paper Details

Date Published: 14 June 2001
PDF: 9 pages
Proc. SPIE 4332, Smart Structures and Materials 2001: Industrial and Commercial Applications of Smart Structures Technologies, (14 June 2001); doi: 10.1117/12.429646
Show Author Affiliations
Mark Lin, Acellent Technologies, Inc. (United States)
Xinlin Qing, Acellent Technologies, Inc. (United States)
Amrita Kumar, Acellent Technologies, Inc. (United States)
Shawn J. Beard, Acellent Technologies, Inc. (United States)

Published in SPIE Proceedings Vol. 4332:
Smart Structures and Materials 2001: Industrial and Commercial Applications of Smart Structures Technologies
Anna-Maria Rivas McGowan, Editor(s)

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