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Proceedings Paper

High-order birefringence and dispersion measurement using spectroscopy of polarized light
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Paper Abstract

This paper describes a method and device for measurement of two-dimensional retardance and dispersion with high-order and azimuthal direction. The system consists of a white light source, crossed polarizers and a detector for spectroscopic polarized light. A spectroscopic interferogram shows sinusoidal to wave number change, and its period changes slightly because of dispersion of birefringence. Fourier transform method is used to analyze the birefringence from the spectroscopic interferogram. One hundred and twenty-eight sets of images are used for birefringence analysis. Some results of 2D birefringence distribution with dispersion are shown for the demonstration.

Paper Details

Date Published: 8 May 2001
PDF: 4 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001);
Show Author Affiliations
Toshitaka Wakayama, Tokyo A&T Univ. (Japan)
Hiroyuki Kowa, Uniopt Co., Ltd. (Japan)
Yukitoshi Otani, Tokyo A&T Univ. (Japan)
Norihiro Umeda, Tokyo A&T Univ. (Japan)
Toru Yoshizawa, Tokyo A&T Univ. (Japan)

Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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