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Proceedings Paper

Dynamic measurement of plastic deformation field by ESPI
Author(s): Satoru Toyooka; Qing-Chuan Zhang; V. Madjarova; - Suprapedi; Rini Widiastuti
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Paper Abstract

In this paper, a dual-beam in-plane sensitive electronic speckle pattern interferometry (ESPI) is applied to observe the degradation process of aluminum alloy plates under loading conditions. A quantitative phase analysis is performed using an addition-subtraction method.

Paper Details

Date Published: 8 May 2001
PDF: 4 pages
Proc. SPIE 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001), (8 May 2001); doi: 10.1117/12.427024
Show Author Affiliations
Satoru Toyooka, Saitama Univ. (Japan)
Qing-Chuan Zhang, Saitama Univ. (Japan)
V. Madjarova, Saitama Univ. (Japan)
- Suprapedi, Indonesian Institute of Sciences (Indonesia)
Rini Widiastuti, Saitama Univ. (Japan)

Published in SPIE Proceedings Vol. 4416:
Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
Koichi Iwata, Editor(s)

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