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Proceedings Paper

Transversal-readout CMOS active pixel image sensor
Author(s): Shigehiro Miyatake; Kouichi Ishida; Takashi Morimoto; Yasuo Masaki; Hideki Tanabe
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Paper Abstract

This paper presents a CMOS active pixel image sensor (APS) with a transversal readout architecture that eliminates the vertically striped fixed pattern noise (FPN). There are two kinds of FPNs for CMOS APSs. One originates form the pixel- to-pixel variation in dark current and source-follower threshold voltage, and the other from the column-to-column variation in column readout structures. The former may become invisible in the future due to process improvements. However, the latter, which result sin a vertically striped FPN, is and will be conspicuous without some subtraction because of the correlation in the vertical direction. The pixel consists of a photodiode, a row- and a column-reset transistor, a source follower input transistor, and a column-select transistor instead of the row-select transistor in conventional CMOS APSs. The column-select transistor is connected to a signal line, which runs horizontally instead of vertically. Every horizontal signal line is merged into a single vertical signal line via a row- select transistor, which can be made large enough to make its on-resistence variation negligible because of its low driving frequency. Therefore, the sensor has neither a vertical nor horizontal stripe FPN.

Paper Details

Date Published: 15 May 2001
PDF: 9 pages
Proc. SPIE 4306, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II, (15 May 2001); doi: 10.1117/12.426949
Show Author Affiliations
Shigehiro Miyatake, Minolta Co., Ltd. (Japan)
Kouichi Ishida, Minolta Co., Ltd. (Japan)
Takashi Morimoto, Minolta Co., Ltd. (Japan)
Yasuo Masaki, Gazoh System Kaihatsu, Inc. (Japan)
Hideki Tanabe, Gazoh System Kaihatsu, Inc. (Japan)

Published in SPIE Proceedings Vol. 4306:
Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications II
Nitin Sampat; Morley M. Blouke; John Canosa; John Canosa; Nitin Sampat, Editor(s)

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