
Proceedings Paper
Rotating polarizer and rotating retarder plate polarimeters: comparison of performancesFormat | Member Price | Non-Member Price |
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Paper Abstract
Rotating polarizer and rotating retarder plate polarimeters are widely used in high-resolution polarimetry, for example in remote sensing, fiber optic measurements and biomedics; as a consequence the analysis of the performances of these devices is very important from the instrumental point of view. To compare the two methods, we developed a synchronous polarimeter based on a mechanically rotating stage, where a rotating Glan-Thompson linear polarizer or a wave retarder can be easily mounted. A specific design allows to acquire synchronously the intensity signals digitally process the data to extract the polarization Stokes parameters. We investigate the two cases along with their impact on measurement techniques. Performance curves are shown for various polarization input parameters and light levels. Specifically, we address issues concerning the accuracy and the systematic and statistical measuring errors. Moreover, computer simulations and measurement results are presented and discussed.
Paper Details
Date Published: 17 May 2001
PDF: 9 pages
Proc. SPIE 4285, Testing, Reliability, and Applications of Optoelectronic Devices, (17 May 2001); doi: 10.1117/12.426894
Published in SPIE Proceedings Vol. 4285:
Testing, Reliability, and Applications of Optoelectronic Devices
Aland K. Chin; S. C. Wang; Niloy K. Dutta; Niloy K. Dutta; Kurt J. Linden; S. C. Wang, Editor(s)
PDF: 9 pages
Proc. SPIE 4285, Testing, Reliability, and Applications of Optoelectronic Devices, (17 May 2001); doi: 10.1117/12.426894
Show Author Affiliations
Stefano Pelizzari, Univ. degli Studi di Brescia (Italy)
Luigi Rovati, Univ. degli Studi di Brescia (Italy)
Luigi Rovati, Univ. degli Studi di Brescia (Italy)
C. De Angelis, Univ. degli Studi di Brescia (Italy)
Published in SPIE Proceedings Vol. 4285:
Testing, Reliability, and Applications of Optoelectronic Devices
Aland K. Chin; S. C. Wang; Niloy K. Dutta; Niloy K. Dutta; Kurt J. Linden; S. C. Wang, Editor(s)
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