We investigated the effect of substrate orientation and film thickness on the microstructure and magnetic properties of Sr- ferrite films grown on (0001) and 1102) sapphire substrates by pulsed laser deposition (PLD). The films grown on (1102) sapphire displayed a presence of various magnetic phases, including SrFe₁₂O₁₉ Fe₂O₃ and Fe₃O₄. The single hexaferrite phase was obtained in GIXRD at 1 degree and 5 degree for the thicker film. The structure measurements showed that all films on (0001) sapphire were single-phase c- axis oriented hexaferrites. The highest in-plane coercive force of 2.5 kOe was detected for the thicker film grown on (1102) sapphire. These films exhibit the highest in-plane squareness. The saturation magnetization of the films on (0001) sapphire rose when the film thickness was reduced.

Date Published: 9 April 2001
PDF: 5 pages
Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); doi: 10.1117/12.425155

Published in SPIE Proceedings Vol. 4397:
11th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Stefka Cartaleva, Editor(s)