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Proceedings Paper

Influence of substrate orientation on the characteristics of Sr-ferrite thin films obtained by pulsed laser deposition
Author(s): Mihaela E. Koleva; Rumen I. Tomov; S. Zotova; Peter A. Atanasov; Carmen Ristoscu; V. D. Nelea; Simona Arens; Eniko Gyorgy; Ion N. Mihailescu; Silviu Colis
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Paper Abstract

We investigated the effect of substrate orientation and film thickness on the microstructure and magnetic properties of Sr- ferrite films grown on (0001) and 1102) sapphire substrates by pulsed laser deposition (PLD). The films grown on (1102) sapphire displayed a presence of various magnetic phases, including SrFe12O19 Fe2O3 and Fe3O4. The single hexaferrite phase was obtained in GIXRD at 1 degree and 5 degree for the thicker film. The structure measurements showed that all films on (0001) sapphire were single-phase c- axis oriented hexaferrites. The highest in-plane coercive force of 2.5 kOe was detected for the thicker film grown on (1102) sapphire. These films exhibit the highest in-plane squareness. The saturation magnetization of the films on (0001) sapphire rose when the film thickness was reduced.

Paper Details

Date Published: 9 April 2001
PDF: 5 pages
Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); doi: 10.1117/12.425155
Show Author Affiliations
Mihaela E. Koleva, Institute of Electronics (Bulgaria)
Rumen I. Tomov, Institute of Electronics (Bulgaria)
S. Zotova, Institute of Electronics (Bulgaria)
Peter A. Atanasov, Institute of Electronics (Bulgaria)
Carmen Ristoscu, Institute of Atomic Physics (Romania)
V. D. Nelea, Institute of Atomic Physics (Romania)
Simona Arens, Institute of Atomic Physics (Romania)
Eniko Gyorgy, Institute of Atomic Physics (Romania)
Ion N. Mihailescu, Institute of Atomic Physics (Romania)
Silviu Colis, Institut de Physique et Chimie des Materiaux de Strasbourg (France)

Published in SPIE Proceedings Vol. 4397:
11th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Stefka Cartaleva, Editor(s)

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