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Proceedings Paper

Structural and optical properties of PLZT thin films deposited by pulsed laser deposition
Author(s): Jan Lancok; Miroslav Jelinek; Ludovic Escoubas; Francois Flory
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Paper Abstract

The ferroelectric Pb1-xLax(ZryTiz)(1- x/4)O3 (PLZT) (x equals 0.09, y equals 0.65, z equals 0.35) optical waveguiding thin films have been prepared on fused silica, (001) quartz, (0001) sapphire and CeO2 coated (11 02) sapphire substrates by pulsed laser deposition. X-ray 20 scans showed that the films are amorphous, highly pyrochlore <110> and highly <110> pseudocubic perovskite textured. The chemical composition of the films was determined by WDX and the influence of oxygen partial pressure on the lead content was observed. The optical waveguiding properties of the films were characterized using a rutile prism coupling method. The distinct m-lines of the guided TE and TM modes of the films have been observed. The refractive index measured by m-line technique reached value about 2.2 at 633 nm wavelength, which is close to the PLZT bulk value. The films have transmittance of about 70% at the wavelength 400 nm.

Paper Details

Date Published: 9 April 2001
PDF: 4 pages
Proc. SPIE 4397, 11th International School on Quantum Electronics: Laser Physics and Applications, (9 April 2001); doi: 10.1117/12.425153
Show Author Affiliations
Jan Lancok, Institute of Physics (Czech Republic)
Miroslav Jelinek, Institute of Physics (Czech Republic)
Ludovic Escoubas, Ecole Nationale Superieure de Physique de Marseille (France)
Francois Flory, Ecole Nationale Superieure de Physique de Marseille (France)

Published in SPIE Proceedings Vol. 4397:
11th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Stefka Cartaleva, Editor(s)

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