In this paper, we present our new Coblentz Hemisphere based Angular Resolved and Integral Scattering Measurement Apparatus (CHARISMA). It is based on the combination of the well known Coblentz-Hemisphere used for integral scattering measurements and highly sensitive camera system developed at the Laser-Laboratorium Goettingen. Using CHARISMA, single- shot determination of the bidirectional reflectance distribution (BRDF) of optical samples is possible. Due to the spherical aberrations in the high-precision machined Coblentz-Hemisphere, the light scattered from a sample is not imaged onto a single spot but rather onto a stratified area. From this light distribution monitored by the camera system the angular-resolved scattering distribution can be evaluated unambiguously using a sophisticated complicated mathematical transformation.

Date Published: 12 April 2001
PDF: 10 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425029

Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)