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Proceedings Paper

CHARISMA: a new way for angular-resolved scattering measurements
Author(s): Oliver Apel; Christian Goerling; Uwe Leinhos; Klaus R. Mann; Bernd Schaefer
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Paper Abstract

In this paper, we present our new Coblentz Hemisphere based Angular Resolved and Integral Scattering Measurement Apparatus (CHARISMA). It is based on the combination of the well known Coblentz-Hemisphere used for integral scattering measurements and highly sensitive camera system developed at the Laser-Laboratorium Goettingen. Using CHARISMA, single- shot determination of the bidirectional reflectance distribution (BRDF) of optical samples is possible. Due to the spherical aberrations in the high-precision machined Coblentz-Hemisphere, the light scattered from a sample is not imaged onto a single spot but rather onto a stratified area. From this light distribution monitored by the camera system the angular-resolved scattering distribution can be evaluated unambiguously using a sophisticated complicated mathematical transformation.

Paper Details

Date Published: 12 April 2001
PDF: 10 pages
Proc. SPIE 4347, Laser-Induced Damage in Optical Materials: 2000, (12 April 2001); doi: 10.1117/12.425029
Show Author Affiliations
Oliver Apel, Laser-Lab. Goettingen eV (Germany)
Christian Goerling, Laser-Lab. Goettingen eV (Germany)
Uwe Leinhos, Laser-Lab. Goettingen eV (Germany)
Klaus R. Mann, Laser-Lab. Goettingen eV (Germany)
Bernd Schaefer, Laser-Lab. Goettingen eV (Germany)

Published in SPIE Proceedings Vol. 4347:
Laser-Induced Damage in Optical Materials: 2000
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; Keith L. Lewis; M. J. Soileau, Editor(s)

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