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Proceedings Paper

Constructing isosurfaces in a localized fashion using an underlying octree data structure
Author(s): Dmitriy V. Pinskiy; Eric S. Brugger; Sean D. Ahern; Bernd Hamann
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Paper Abstract

We present an octree-based approach for iso surface extraction from large volumetric scalar-valued data. Given scattered points with associated function values, we impose an octree structure of relatively low resolution. Octree construction is controlled by original data resolution and cell-specific error values. For each cell in the octree, we compute an average function value and additional statistical data for the original points inside the cell. Once a specific iso value is specified, we adjust the initial octree by expanding its leaves based on a comparison of the statics with the iso value. We tetrahedrize the centers of the octree's cells to determine tetrahedral meshes decomposing the entire spatial domain of the dat, including a possibly specified region of interest (ROI). Extracted iso surfaces are crack-free inside an ROI, but cracks can appear at the boundary of an ROI. The initial iso surface is an approximation of the exact one, but its quality suffices for a viewer to identify an ROI where more accuracy is desirable. In the refinement process, we refine affected octree nodes and update the triangulation locally to produce better iso surface representations. This adaptive and user- driven refinement provides a means for interactive data exploration via real-time and local iso surface extraction.

Paper Details

Date Published: 3 May 2001
PDF: 11 pages
Proc. SPIE 4302, Visual Data Exploration and Analysis VIII, (3 May 2001); doi: 10.1117/12.424919
Show Author Affiliations
Dmitriy V. Pinskiy, Univ. of California/Davis (United States)
Eric S. Brugger, Lawrence Livermore National Lab. (United States)
Sean D. Ahern, Lawrence Livermore National Lab. (United States)
Bernd Hamann, Univ. of California/Davis (United States)

Published in SPIE Proceedings Vol. 4302:
Visual Data Exploration and Analysis VIII
Robert F. Erbacher; Philip C. Chen; Jonathan C. Roberts; Craig M. Wittenbrink; Matti Grohn, Editor(s)

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