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Proceedings Paper

Commercialization of Honeywell's VCSEL technology: further developments
Author(s): James K. Guenter; Jim A. Tatum; Andrew Clark; R. Scott Penner; Ralph H. Johnson; Robert A. Hawthorne III; J. Robert Biard; Yue Liu
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Paper Abstract

Each year, more VCSEL technologies make the transition from research curiosities to commercially available products. In this paper we describe several such technologies at Honeywell, each at a different stage of that transition. Oxide-confined devices are already past the transition stage. We describe the generally excellent reliability of oxide-confined devices already in high-volume production, and compare it to results of the most recent-and possibly last-long-term reliability study of proton-implanted VCSELs. We report on detailed package-VCSEL interaction modeling, which is being used to improve performance and extend the life of common form-factor packages. We also note Honeywell's progress toward commercialization of VCSELs and allied products at wavelengths other than 850 nm.

Paper Details

Date Published: 4 May 2001
PDF: 14 pages
Proc. SPIE 4286, Vertical-Cavity Surface-Emitting Lasers V, (4 May 2001); doi: 10.1117/12.424790
Show Author Affiliations
James K. Guenter, Honeywell, Inc. (United States)
Jim A. Tatum, Honeywell, Inc. (United States)
Andrew Clark, Honeywell, Inc. (United States)
R. Scott Penner, Honeywell, Inc. (United States)
Ralph H. Johnson, Honeywell, Inc. (United States)
Robert A. Hawthorne III, Honeywell, Inc. (United States)
J. Robert Biard, Honeywell, Inc. (United States)
Yue Liu, Honeywell, Inc. (United States)

Published in SPIE Proceedings Vol. 4286:
Vertical-Cavity Surface-Emitting Lasers V
Kent D. Choquette; Chun Lei, Editor(s)

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